A Statistical Reliability Model for Single-Electron Threshold Logic
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Bibliographic record
Abstract
As one of the most promising candidates for future digital circuit applications, single-electron tunneling (SET) technology has been used to ensure further feature size reduction and ultralow power dissipation. However, this technology raises very serious concerns about reliable functioning, particularly due to random background charges and tight fabrication tolerances. Accurate evaluation of reliability for SET circuits has thus become a crucial step toward their reliability analysis and improvement. This brief proposes a statistical reliability model for SET logic gates, which takes into account the actual process variations and input probabilities. In particular, we study two typical SET logic gates (two-input nor and nand gates) for gate reliability evaluation. Instead of assuming a constant failure rate for logic gates as in most previous work, we show how logic inputs affect the reliability of the individual gates with discussions on the overall reliability of the system consisting of logic gates. This model can be used in future computer-aided design tools to estimate tunneling events, energy consumption, and reliability of SET-based digital logic circuits.
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Full frame distilled prediction
Teacher imitationNot calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.
Codex and Gemma teacher scores by category
| Category | Codex | Gemma |
|---|---|---|
| Metaresearch | 0.000 | 0.000 |
| Meta-epidemiology (narrow) | 0.000 | 0.000 |
| Meta-epidemiology (broad) | 0.000 | 0.000 |
| Bibliometrics | 0.000 | 0.000 |
| Science and technology studies | 0.000 | 0.000 |
| Scholarly communication | 0.000 | 0.000 |
| Open science | 0.000 | 0.000 |
| Research integrity | 0.000 | 0.000 |
| Insufficient payload (model declined to judge) | 0.000 | 0.000 |
Machine scores (provisional)
The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.
Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.
score_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it