On the Number of Noise Parameters for Analyses of Circuits With MOSFETs
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Bibliographic record
Abstract
The inequality relating F <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">min</sub> and Lange invariant N for any noisy linear two-port network has been known since the 1980s. However, the applicability of this inequality to MOSFETs is not discussed in the literature, and thus, this inequality is not normally treated in analyses and designs of circuits based on MOSFETs. This work shows that by using N, the number of noise parameters required to model high-frequency noise of intrinsic MOSFETs can be reduced by one. This reduction in the noise parameters simplifies the noise correlation matrices, which leads to simpler noise factor expressions. A new set of noise correlation matrices and noise factor expressions is presented. These are expected to ease circuit optimizations of low-noise amplifiers and other circuits based on intrinsic MOSFET models.
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Teacher imitationNot calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.
Codex and Gemma teacher scores by category
| Category | Codex | Gemma |
|---|---|---|
| Metaresearch | 0.000 | 0.000 |
| Meta-epidemiology (narrow) | 0.000 | 0.000 |
| Meta-epidemiology (broad) | 0.000 | 0.000 |
| Bibliometrics | 0.000 | 0.000 |
| Science and technology studies | 0.000 | 0.000 |
| Scholarly communication | 0.000 | 0.000 |
| Open science | 0.000 | 0.000 |
| Research integrity | 0.000 | 0.000 |
| Insufficient payload (model declined to judge) | 0.000 | 0.000 |
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Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.
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