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Record W2151082990 · doi:10.1109/ias.1989.96902

Latent failures due to ESD in CMOS integrated circuits

2003· article· en· W2151082990 on OpenAlexaff
W.D. Greason, Z. Kucerovsky, K.W.K. Chum

Bibliographic record

VenueConference Record of the IEEE Industry Applications Society Annual Meeting · 2003
Typearticle
Languageen
FieldEngineering
TopicElectrostatic Discharge in Electronics
Canadian institutionsWestern University
Fundersnot available
KeywordsCMOSElectrostatic dischargeElectronic circuitIntegrated circuitElectronic engineeringComputer scienceElectrical engineeringVoltageMaterials scienceEngineering

Abstract

fetched live from OpenAlex

A review is presented of the current information published on the subject of ESD (electrostatic discharge) latent failures. In order to gain a better understanding of the phenomena involved in the input and output protection networks of CMOS integrated circuits, a series of measurements was performed on both commercially available integrated circuits and a set of custom designed and fabricated devices. The tests investigated the effects of electrical stress, thermal shock, exposure to visible and ultraviolet light, and thermal annealing. The results demonstrate the presence of latent failures in CMOS integrated circuits following exposure to ESD. The cumulative effect of repeated discharges can be partially alleviated using thermal annealing or exposure to light. A charge injection model is proposed to interpret the results.>

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.001
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: none
GenreCandidate signal: Empirical · Consensus signal: none
Teacher disagreement score0.002
Threshold uncertainty score0.006

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.001
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0010.000
Bibliometrics0.0010.001
Science and technology studies0.0000.000
Scholarly communication0.0010.001
Open science0.0010.000
Research integrity0.0010.000
Insufficient payload (model declined to judge)0.0020.001

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.015
GPT teacher head0.240
Teacher spread0.224 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations5
Published2003
Admission routes1
Has abstractyes

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Same venueConference Record of the IEEE Industry Applications Society Annual MeetingSame topicElectrostatic Discharge in ElectronicsFrench-language works237,207