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Record W2168197708 · doi:10.1109/tcsii.2005.852531

System-level test and yield improvement for optoelectronic-VLSI chips

2005· article· en· W2168197708 on OpenAlexaff
Jacques Thibodeau, Michael B. Venditti, David V. Plant

Bibliographic record

VenueIEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing · 2005
Typearticle
Languageen
FieldComputer Science
TopicVLSI and Analog Circuit Testing
Canadian institutionsMcGill University
Fundersnot available
KeywordsVery-large-scale integrationYield (engineering)OptoelectronicsTest (biology)Materials scienceComputer scienceEmbedded systemComposite materialGeology

Abstract

fetched live from OpenAlex

Some of the unique issues involved in testing transmitter and receiver circuits for optoelectronic-very-large-scale-integrated (OE-VLSI) applications are reviewed. In particular, the problem of testing OE-VLSI chips prior to optoelectronic device integration is outlined. Based on circuit-level approaches such as fault sensitization and novel system-level testing methodologies, the first OE-VLSI chip with testable transmitters, receivers and digital circuitry was designed in 0.35-/spl mu/m CMOS. The operation of the ASIC was verified experimentally and a fault-coverage greater than 80% is obtained, for a test time in the hundreds of microseconds range. Yield improvements ranging from 10% to 25% are predicted.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesMeta-epidemiology (narrow), Scholarly communication
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Other design · Consensus signal: none
GenreCandidate signal: Empirical · Consensus signal: none
Teacher disagreement score0.992
Threshold uncertainty score1.000

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0010.000
Scholarly communication0.0010.001
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.032
GPT teacher head0.231
Teacher spread0.199 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

Study designOther design
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations0
Published2005
Admission routes1
Has abstractyes

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