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Record W2479224809 · doi:10.1117/3.601520.ch12

Alternative Lithography Techniques

2009· book-chapter· en· W2479224809 on OpenAlexaff
Harry Levinson

Bibliographic record

VenueSPIE eBooks · 2009
Typebook-chapter
Languageen
FieldEngineering
TopicAdvancements in Photolithography Techniques
Canadian institutionsAdvanced Micro Devices (Canada)
Fundersnot available
KeywordsExtreme ultraviolet lithographyLithographyNext-generation lithographyX-ray lithographyOpticsDiffractionPhotolithographyMaskless lithographyElectron-beam lithographyComputational lithographyStencil lithographyMaterials scienceResistPhysicsOptoelectronicsNanotechnology

Abstract

fetched live from OpenAlex

Because the resolution capability of optical lithography is fundamentally limited by the phenomenon of diffraction, work is ongoing to develop alternative lithography technologies that can support the continuation of Moore's Law past the diffraction limit that was estimated in Chapter 10. These alternative techniques are often called next-generation lithographies, and are frequently referred to by the acronym, NGL. A number of alternatives to optical lithography have been conceived, but none has yet been developed to the point that it is ready for implementation in manufacturing. Several next-generation lithographic techniques—proximity x-ray, extreme ultraviolet (EUV), electron beam and optical direct write, electron projection, and ion-projection lithography—are discussed in this chapter. Each of these approaches has technical challenges that must be overcome before they will be usable in semiconductor manufacturing. In this chapter, the basic concepts underlying several of these technologies are discussed, and the challenges that need to be addressed are highlighted. 12.1 Proximity x-ray lithography Optical lithography is limited by diffraction, which is most significant when objects are comparable in size to the wavelength of light. This fact of physics has driven decreases in the wavelength of light used in optical lithography. Similarly, the use for lithography of wavelengths in the x-ray portion of the electromagnetic spectrum was motivated by the idea that diffraction effects could be effectively neutralized by using photons with extremely short wavelengths. However, at x-ray wavelengths there are no known materials for making image-forming lenses or mirrors. Consequently, x-ray lithography involves the use of proximity printing, where the mask is brought to within a few microns of the wafer and the x rays are passed directly through the mask and onto the wafer (Fig. 12.1). This is in contrast to optical lithography, which has the potential for projection of the image by a lens. Since there are no materials that are highly transparent, x-ray masks are comprised of very thin membranes (thickness < 2 μm) comprised of low-atomic-number materials, on which the circuit patterns are placed in the form of high-atomic-number material (Fig. 12.1). A large percentage of the x rays pass through the low-atomic-number material, but the x rays are generally absorbed or scattered by the high-atomic-number materials, thus generating a pattern contrast. Silicon carbide is a typical membrane material, and silicon nitride films were used early in the development of x-ray lithography.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.001
metaresearch head score (Gemma)0.001
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Not applicable · Consensus signal: none
GenreCandidate signal: Other · Consensus signal: none
Teacher disagreement score0.022
Threshold uncertainty score0.072

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0010.001
Meta-epidemiology (narrow)0.0010.001
Meta-epidemiology (broad)0.0010.001
Bibliometrics0.0020.002
Science and technology studies0.0010.001
Scholarly communication0.0020.003
Open science0.0020.002
Research integrity0.0020.002
Insufficient payload (model declined to judge)0.0220.011

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.012
GPT teacher head0.240
Teacher spread0.228 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designNot applicable
Domainnot available
GenreOther

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations1
Published2009
Admission routes1
Has abstractyes

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