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Record W2790908989

Magnetic force microscopy imaging of current paths in integrated circuits with overlayers

2007· article· en· W2790908989 on OpenAlexvenueno aff
A. Pu

Bibliographic record

VenueLibrary and Archives Canada (Government of Canada) · 2007
Typearticle
Languageen
FieldPhysics and Astronomy
TopicForce Microscopy Techniques and Applications
Canadian institutionsnot available
Fundersnot available
KeywordsCurrent (fluid)MicroscopyMagnetic force microscopeMaterials scienceNanotechnologyComputer scienceElectrical engineeringPhysicsMagnetic fieldOpticsEngineeringMagnetization
DOInot available

Abstract

fetched live from OpenAlex

Imaging of current in internal conductors through magnetic field detection by magnetic force microscopy (MFM) is of growing interest in the analysis of integrated circuits (ICs). This thesis presents a systematic study of the MFM based mapping of current in model circuits by using force and force gradient techniques. In comparing these two techniques, force was found to have a much higher signal to noise ratio (from ~150 to ~580 times) than force gradient at large tip-sample distances considering the presence of thick overlayers in ICs. As a result, force will have better sensitivity and can therefore be used to detect much smaller minimum currents. We have achieved a sensitivity of ~0.64 µA per square-root Hertz in air and ~0.095 µA per squre-root Hertz in vacuum for force with a pinning field with a probe-circuit separation of 1.0 µm. We conclude that the force technique is superior for the application of MFM current imaging of buried conductors, albeit with reduced spatial resolution. Numerical modeling of the MFM images has shown that the simple point probe approximation is insufficient to model MFM images. An extended model, which considers realistic MFM probe geometries and the forces acting on the whole probe, has been shown to be necessary. Qualitative and quantitative comparisons of the experimental and simulation results with this model are in agreement to within experimental uncertainty. The comparisons suggested that the CoCr film thickness is not uniform on the probe, which was verified by scanning electron microscope cross-section images of the probes cut by a focused ion beam. Most notably, the CoCr film was 1.5 times thicker on the cantilever than on the tip. Based on the simulation and experimental results, we have devised a method to accurately locate the current path from MFM images with submicrometer uncertainty. The method was tested for different patterns of model conducting lines. It was shown to be a useful technique for fault location in IC failure analysis when current flows through the devices buried under overlayers and no topographic features are on the surface to provide clues about the positions of the devices.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.001
Threshold uncertainty score0.003

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0010.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.003
GPT teacher head0.180
Teacher spread0.178 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations0
Published2007
Admission routes1
Has abstractyes

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