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Record W3190968529 · doi:10.1109/ectc32696.2021.00360

Prognostic Detection of Electromigration Void Failure in Buried Metal Interconnect using Piezoresistive Sensors

2021· article· en· W3190968529 on OpenAlexaff
Ari Laor, David Nairn

Bibliographic record

Venuenot available
Typearticle
Languageen
FieldEngineering
TopicSemiconductor materials and devices
Canadian institutionsUniversity of Waterloo
Fundersnot available
KeywordsElectromigrationMaterials scienceVoid (composites)InterconnectionFlip chipPiezoresistive effectResistive touchscreenOptoelectronicsComposite materialComputer scienceElectrical engineeringEngineering

Abstract

fetched live from OpenAlex

A novel applied reliability tool is presented to prognostically detect electromigation (EM) failures within VLSI buried metal interconnect trees. This is achieved non-destructively, in-situ, using piezo-restive sensors located at the likely point of failure. In practical applications, electrical detection of impending failures is limited to detecting the void growth at the onset of failure, when void growth almost entirely spans the metal segment. Prior to failure, the electrical changes are too small in magnitude to be pragmatically measured. Instead, piezo-resistive sensors are used to detect mechanical stress changes near the substrate as the failure progresses. A test chip has been developed in a cost effective 180nm technology with 24 active reservoir structures and respectively 24 piezo-restive sensors located at the segment's cathode where the void formation is stimulated. The metal segments are tuned to fail at an accelerated rate and include embedded mechanical sensors below to detect the changes. First a metal segment is tuned to fail by employing active reservoirs, extra current carrying metal extrusion that can alter the hydrostatic stress within metal lines proportionally to the applied current density, to accelerate void formation and subsequent growth. These allow geometrically identical metal segments to fail at different rates by tuning their respective current densities. Additionally, the accelerated void growth can be achieved without the need for elevated temperatures above 125C allowing for use in conventional devices and commercial applications. The local mechanical changes caused by void growth can be detected by taking advantage of the piezo-resistive properties of the semiconductor layers below the metal lines. To verify and monitor the test segment's resistance increase over time, four-wire resistance probes are built into the test structures. In this case the stress is measured and compared at two reference temperatures for two geometrically identical segments. The first segment with the active reservoir engaged as a sink and the other dormant as a healthy reference structure. The thermal expansion of a voided line is sufficiently different from the healthy reference and the void growth can be detected in this way.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.022
Threshold uncertainty score0.351

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.011
GPT teacher head0.213
Teacher spread0.202 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations0
Published2021
Admission routes1
Has abstractyes

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