On-Chip Dynamic Gate-Voltage Waveform Sampling in a 200-V GaN-on-SOI Power IC
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Bibliographic record
Abstract
The continual improvement of GaN-on-Si processes motivates the integration of more complex circuits alongside GaN power devices. Additional transistors can be leveraged to provide control, logic, and protection; however, low-voltage GaN devices consume more power and area than similar CMOS counterparts. This article investigates the feasibility of a monolithic gate-monitoring circuit integrated with a GaN power device and gate driver. The monitoring circuit captures 16 samples within 50 ns during the gate rising transient and stores them in on-chip capacitors. The stored voltages are asynchronously read off-chip through integrated source-follower buffers and a digitally controlled multiplexer. The proposed design incorporates approximately 330 e-HEMT transistors and was fabricated in a 200-V GaN-on-SOI process. A detailed characterization was performed to calibrate the dynamic on-chip gate voltage from the sampled values that are read off-chip, paving the way for future active control based on this feedback. Experimental results and the postcalibration estimate of the on-chip gate voltage highlight that off-chip measurements are poor and pessimistic estimators for the on-chip dynamic excursions. The on-chip gate-voltage waveform was estimated using the sampling circuit while switching the power device at 80 V, 1.5 A, demonstrating more accurate measurements of on-chip signals. This circuit stands as a proof-of-concept for the viability of integrating relatively complex circuits in GaN power ICs to perform critical monitoring and sensing tasks.
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Full frame distilled prediction
Teacher imitationNot calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.
Codex and Gemma teacher scores by category
| Category | Codex | Gemma |
|---|---|---|
| Metaresearch | 0.001 | 0.000 |
| Meta-epidemiology (narrow) | 0.000 | 0.000 |
| Meta-epidemiology (broad) | 0.000 | 0.000 |
| Bibliometrics | 0.000 | 0.001 |
| Science and technology studies | 0.000 | 0.000 |
| Scholarly communication | 0.000 | 0.000 |
| Open science | 0.000 | 0.000 |
| Research integrity | 0.000 | 0.001 |
| Insufficient payload (model declined to judge) | 0.000 | 0.000 |
Machine scores (provisional)
The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.
Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.
score_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it