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Record W4226330983 · doi:10.1109/jestpe.2022.3163646

On-Chip Dynamic Gate-Voltage Waveform Sampling in a 200-V GaN-on-SOI Power IC

2022· article· en· W4226330983 on OpenAlexafffund
Samantha K. Murray, W. L. Jiang, Mohammad Shawkat Zaman, Herbert De Vleeschouwer, P. Moens, J. Roig, Olivier Trescases

Bibliographic record

VenueIEEE Journal of Emerging and Selected Topics in Power Electronics · 2022
Typearticle
Languageen
FieldPhysics and Astronomy
TopicGaN-based semiconductor devices and materials
Canadian institutionsUniversity of Toronto
FundersNatural Sciences and Engineering Research Council of Canada
KeywordsChipTransistorElectrical engineeringElectronic engineeringCMOSIntegrated circuitVoltageWaveformMaterials scienceComputer scienceEngineering

Abstract

fetched live from OpenAlex

The continual improvement of GaN-on-Si processes motivates the integration of more complex circuits alongside GaN power devices. Additional transistors can be leveraged to provide control, logic, and protection; however, low-voltage GaN devices consume more power and area than similar CMOS counterparts. This article investigates the feasibility of a monolithic gate-monitoring circuit integrated with a GaN power device and gate driver. The monitoring circuit captures 16 samples within 50 ns during the gate rising transient and stores them in on-chip capacitors. The stored voltages are asynchronously read off-chip through integrated source-follower buffers and a digitally controlled multiplexer. The proposed design incorporates approximately 330 e-HEMT transistors and was fabricated in a 200-V GaN-on-SOI process. A detailed characterization was performed to calibrate the dynamic on-chip gate voltage from the sampled values that are read off-chip, paving the way for future active control based on this feedback. Experimental results and the postcalibration estimate of the on-chip gate voltage highlight that off-chip measurements are poor and pessimistic estimators for the on-chip dynamic excursions. The on-chip gate-voltage waveform was estimated using the sampling circuit while switching the power device at 80 V, 1.5 A, demonstrating more accurate measurements of on-chip signals. This circuit stands as a proof-of-concept for the viability of integrating relatively complex circuits in GaN power ICs to perform critical monitoring and sensing tasks.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.001
Threshold uncertainty score0.004

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0010.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0010.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.010
GPT teacher head0.262
Teacher spread0.253 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations14
Published2022
Admission routes2
Has abstractyes

Explore more

Same venueIEEE Journal of Emerging and Selected Topics in Power ElectronicsSame topicGaN-based semiconductor devices and materialsFrench-language works237,207