MétaCan
Menu
Back to cohort

Statistical and Engineering Process Control of Phosphorus Diffused Solar Wafers Using Contactless Infrared Reflectometry

2022· article· en· W4312676676 on OpenAlexaff
Johnson Wong, Divya Ananthanarayanan, G T Deans

Bibliographic record

Venue2022 IEEE 49th Photovoltaics Specialists Conference (PVSC) · 2022
Typearticle
Languageen
FieldEngineering
TopicSilicon and Solar Cell Technologies
Canadian institutionsMorgan Solar (Canada)
Fundersnot available
KeywordsWaferCommon emitterProcess controlMaterials scienceStatistical process controlDiffusionProcess (computing)ReflectometryProcess engineeringOptoelectronicsComputer scienceEngineering

Abstract

fetched live from OpenAlex

For the silicon solar cell diffusion process, statistical process control (SPC) and engineering process control (EPC) are commonly used to ensure that yield and thoughput targets are met during high-volume industrial production. SPC uses control charts to detect out-of-specification (OOS) wafers that need to be reworked (typically those with emitters that are too lightly diffused to be contactable by the screen printed metal electrode)., EPC involves tuning of diffusion furnace parameters based on feedback from the emitter sheet resistance measurements of prior diffusion batches to reduce process variations and the frequency of OOS events. Both of these process control techniques, SPC and EPC, rely on sampled measurements of diffused wafers over each diffusion batch. This paper focuses on best practices and unique advantages of the use of contactless infrared reflectometry (IR) measurements of phosphorus-diffused wafers to implement SPC and EPC.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesMeta-epidemiology (narrow)
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: none
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.637
Threshold uncertainty score1.000

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.001
Meta-epidemiology (broad)0.0010.000
Bibliometrics0.0000.001
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0010.000
Research integrity0.0000.001
Insufficient payload (model declined to judge)0.0010.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.019
GPT teacher head0.245
Teacher spread0.226 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations0
Published2022
Admission routes1
Has abstractyes

Explore more

Same venue2022 IEEE 49th Photovoltaics Specialists Conference (PVSC)Same topicSilicon and Solar Cell TechnologiesFrench-language works237,207