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Record W4392387806 · doi:10.4071/001c.94477

Electromigration of Power Devices Part 2: Power Device in Applications in Controlled Environment

2024· article· en· W4392387806 on OpenAlex

Why this work is in the frame

A frame that forgets how it found something cannot be audited. These are the routes that admitted this work.

affAt least one author lists a Canadian institution in the pinned OpenAlex snapshot.

Bibliographic record

VenueIMAPSource Proceedings · 2024
Typearticle
Languageen
FieldEngineering
TopicElectronic Packaging and Soldering Technologies
Canadian institutionsInfineon Technologies (Canada)
Fundersnot available
KeywordsElectromigrationJunction temperatureReliability (semiconductor)Power semiconductor deviceCurrent (fluid)Power (physics)DissipationPower moduleSemiconductor deviceWork (physics)Electrical engineeringComputer scienceMaterials scienceReliability engineeringMechanical engineeringEngineeringVoltagePhysics

Abstract

fetched live from OpenAlex

In the power semiconductor industry, there is a continuous development toward a higher current capability of devices while device’s dimensions shrink. Although higher current is preferred, the reliability risk of the electromigration (EM) remains challenging. In the present study, a special EM test vehicle is used to investigate the pure EM behavior of power device, following our previous work. The selection of the test condition is discussed in detail, which is defined based on the temperature and current profiles of the device in the actual application, focusing on the applications of the power devices in a controlled environment, i.e., data centers or telecommunication servers. The current and temperature profiles of the device are discussed based on the device’s maximum power dissipation and its respective thermal design. The results show that the different combinations of currents and temperatures can lead to different ratios of acceleration factor between the temperature and the current. Consequently, an inappropriate selection of the testing condition can result in the over-domination of temperature over the current, leading to wrong conclusions. The effects of the PCB surface finish (both Ni and Sn plating) as well as different electron flow directions on the EM were studied. It is concluded that the maximum current that can be applied to a power device in the application within a controlled environment is rather limited by the cooling capability of the system than the EM induced device failure.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.372
Threshold uncertainty score0.590

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.005
GPT teacher head0.206
Teacher spread0.201 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it