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Record W4407641591 · doi:10.4071/001c.129730

Laser Assisted Bonding for Flip Chip Interconnection of Very Large Chips

2025· article· en· W4407641591 on OpenAlex

Why this work is in the frame

A frame that forgets how it found something cannot be audited. These are the routes that admitted this work.

affAt least one author lists a Canadian institution in the pinned OpenAlex snapshot.
fundA Canadian funder is recorded on the work.

Bibliographic record

VenueIMAPSource Proceedings · 2025
Typearticle
Languageen
FieldEngineering
TopicSemiconductor Lasers and Optical Devices
Canadian institutionsIBM (Canada)Université de Sherbrooke
FundersCentre National de la Recherche ScientifiqueInstitut National des Sciences Appliquées de LyonFonds de recherche du Québec – Nature et technologiesUniversité Grenoble AlpesNatural Sciences and Engineering Research Council of CanadaUniversité de SherbrookeIndian National Science Academy
KeywordsFlip chipInterconnectionMaterials scienceChipLaserOptoelectronicsComputer scienceOpticsNanotechnologyTelecommunicationsPhysics

Abstract

fetched live from OpenAlex

In recent years, laser-assisted bonding (LAB) has emerged as a promising means to address specific flip-chip assembly issues associated with conventional mass-reflow (MR) and thermo-compression bonding (TCB) processes, for example chip warpage reduction. However, studies have predominantly focussed on small to medium sized chips. For memory, processor, and interposer applications, chip sizes may be much larger. The ability to effectively distribute laser energy across such larger interconnection areas is practically unexplored. This paper investigates LAB behavior for a 25mm x 26mm silicon chip comprising Cu pillar/SAC solder interconnects, with a particular focus on the size of the optically generated homogeneous laser beam. A heat transfer study was first conducted to estimate the relationship between chip surface temperature, which can be measured and controlled during the LAB process, and actual joint temperature, the latter requiring a special thermocouple assembly module. The responses allowed the determination of an appropriate range of LAB profile parameters for assembly development. Assembly results reported revealed that beam size extension beyond the chip region is critical to achieving repeatable defect-free interconnection of such large chips. This relationship was additionally supported by thermal finite element modelling (FEM) that demonstrated that the impact of convective effects at the chip periphery on solder joint temperature distribution, and remediation of same by beam size enlargement, became increasingly important with increasing chip size. It was further demonstrated that, despite the larger beam size and its effect on substrate surface temperature, post assembly chip warpage was reduced by about 50% using LAB as compared to the MR process. Finally, microstructural comparisons between LAB and MR validated that initial intermetallic compound (IMC) formations are significantly reduced on these large chip assemblies, in line with previous studies on smaller chips.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.119
Threshold uncertainty score0.628

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.010
GPT teacher head0.236
Teacher spread0.226 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it