MétaCan
Menu
Back to cohort

Analysis of Leakage Currents in Charge Pumps Integrated in Conventional and High-k Technologies

2025· article· W4416728152 on OpenAlexaff
Masoud Askariraad, Stefano Gregori

Bibliographic record

Venuenot available
Typearticle
Language
FieldEngineering
TopicSemiconductor materials and devices
Canadian institutionsUniversity of Guelph
Fundersnot available
KeywordsLeakage (economics)CapacitorFabricationVoltageEquivalent circuitLeakage powerCharge pumpProcess (computing)

Abstract

fetched live from OpenAlex

This paper introduces a model for leakage currents in linear integrated charge pumps, along with the corresponding design procedure. The model accounts for leakage in both capacitors and switches, and it analyzes its effect on the circuit parameters such as conversion ratio, power density, and conversion efficiency. Various design trade-offs emerge when selecting different devices within a given fabrication technology, as well as when comparing different fabrication technologies. Specifically, the paper explores the performance differences between implementing the same circuit in a conventional 65-nm silicon-oxynitride polysilicon-gate process and in a <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$28-\text{nm}$</tex> high-k metal-gate process. The simulation results validate the model and quantify the improvements in power density and conversion efficiency achieved in the high-k process, owing to enhanced device performance and reduced leakage currents.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesInsufficient payload (model declined to judge)
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Observational · Consensus signal: Observational
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.226
Threshold uncertainty score1.000

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0010.000
Bibliometrics0.0020.003
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0010.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.011
GPT teacher head0.248
Teacher spread0.238 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

Study designObservational
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations0
Published2025
Admission routes1
Has abstractyes

Explore more

Same topicSemiconductor materials and devicesFrench-language works237,207