EMAS 2013 Workshop: 13th European Workshop on Modern Developments and Applications in Microbeam Analysis
Notice bibliographique
Résumé
This volume of the IOP Conference Series: Materials Science and Engineering contains papers from the 13th Workshop of the European Microbeam Analysis Society (EMAS) on Modern Developments and Applications in Microbeam Analysis which took place from the 12th to the 16th of May 2013 in the Centro de Congressos do Alfândega, Porto, Portugal. The primary aim of this series of workshops is to assess the state-of-the-art and reliability of microbeam analysis techniques. The workshops also provide a forum where students and young scientists starting out on a career in microbeam analysis can meet and discuss with the established experts. The workshops have a very specific format comprising invited plenary lectures by internationally recognized experts, poster presentations by the participants and round table discussions on the key topics led by specialists in the field. This workshop was organized in collaboration with LNEG - Laboratorio Nacional de Energia e Geologia and SPMICROS - Sociedade Portuguesa de Microscopia. The technical programme included the following topics: electron probe microanalysis, future technologies, electron backscatter diffraction (EBSD), particle analysis, and applications. As at previous workshops there was also a special oral session for young scientists. The best presentation by a young scientist was awarded with an invitation to attend the 2014 Microscopy and Microanalysis meeting at Hartford, Connecticut. The prize went to Shirin Kaboli, of the Department of Metals and Materials Engineering of McGill University (Montreal, Canada), for her talk entitled ''Plastic deformation studies with electron channelling contrast imaging and electron backscattered diffraction''. The continuing relevance of the EMAS workshops and the high regard in which they are held internationally can be seen from the fact that 74 posters from 21 countries were on display at the meeting and that the participants came from as far away as Japan, Canada and the USA. A selection of participants with posters was invited to give a short oral presentation of their work in three dedicated sessions. The prize for the best poster was an invitation to participate in the 22nd Australian Conference on Microscopy and Microanalysis (ACMM 23) at Adelaide, South Australia. The prize was awarded to Pierre Burdet of the EM Group of the Department of Materials Science and Metallurgy of the University of Cambridge (UK), for the poster entitled: ''3D EDS microanalysis by FIB-SEM: advantages of a low take-off angle''. This proceedings volume contains the full texts of 8 of the invited plenary lectures and of 13 papers on related topics originating from the posters presented at the workshop. All the papers have been subjected to peer review by a least two referees. January 2014 Acknowledgements On behalf of the European Microbeam Analysis Society I would like to thank all the invited speakers, session chairs and members of the discussion panels for making the meeting such a great success. Special thanks go to Fernanda Guimaraes and Luc Van't dack who directed the organisation of the workshop giving freely of their time and talents. As was the case for previous workshops, the EMAS board in corpore was responsible for the scientific programme. The Workshop also included a commercial exhibition where many leading instrument suppliers were represented. Several companies that exhibited provided financial support, either by sponsoring an event or by advertising. Below, in alphabetical order, is a list of exhibiting companies and sponsors of the workshop. - Ametek GmbH, Edax Business Unit- IZASA Group Werfen - Bruker Nano GmbH- Jeol (Europe) SAS - Cameca SA- Porto Gran Cruz - Câmara Municipal do Porto- Oxford Instruments NanoAnalysis Ltd. - European Institute for Transuranium Elements (Germany)- Probe Software, Inc. - FEI Company- Tescan, a.s. Michael B Matthews EMAS President
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Comment cette classification a été obtenuedéplier
Prédiction distillée sur la base complète
Imitation des enseignantsNi prévalence calibrée, ni vérité terrain. Validation humaine à venir. Apprise à partir de 10 348 étiquettes directes de Codex et de 10 348 étiquettes directes de Gemma. Le mode candidate est l'union des têtes enseignantes seuillées; le consensus est leur intersection. Ces sorties portent le statut machine_predicted_unvalidated et ne sont ni des étiquettes humaines ni des étiquettes directes de modèles de pointe.
Scores Codex et Gemma par catégorie
| Catégorie | Codex | Gemma |
|---|---|---|
| Métarecherche | 0,001 | 0,000 |
| Méta-épidémiologie (sens strict) | 0,000 | 0,000 |
| Méta-épidémiologie (sens large) | 0,000 | 0,000 |
| Bibliométrie | 0,000 | 0,001 |
| Études des sciences et des technologies | 0,000 | 0,000 |
| Communication savante | 0,001 | 0,001 |
| Science ouverte | 0,000 | 0,000 |
| Intégrité de la recherche | 0,000 | 0,000 |
| Charge utile insuffisante (le modèle a refusé de juger) | 0,000 | 0,000 |
Scores machine (provisoires)
Les deux têtes enseignantes du modèle étudiant, lues sur ce travail. Un score ordonne la base pour la relecture; il n'affirme jamais une catégorie, et le statut de validation accompagne chaque rangée tel quel.
Scores de référence d'un modèle non mature (critères de maturité non atteints, 7 itérations). Un score ordonne; il n'affirme jamais une catégorie.
score_only:v0-immature-baseline · tel quel depuis la passe de notation : score_only signifie que le nombre peut ordonner les travaux, et qu'aucune étiquette de catégorie n'en découleClassification
machine, non validéePrédiction automatique; un appel candidat d’une seule tête enseignante, pas un consensus.
Le détail, modèle par modèle et score par score, se trouve en fin de page sous « Comment cette classification a été obtenue ».