EMAS 2013 Workshop: 13th European Workshop on Modern Developments and Applications in Microbeam Analysis
Bibliographic record
Abstract
This volume of the IOP Conference Series: Materials Science and Engineering contains papers from the 13th Workshop of the European Microbeam Analysis Society (EMAS) on Modern Developments and Applications in Microbeam Analysis which took place from the 12th to the 16th of May 2013 in the Centro de Congressos do Alfândega, Porto, Portugal. The primary aim of this series of workshops is to assess the state-of-the-art and reliability of microbeam analysis techniques. The workshops also provide a forum where students and young scientists starting out on a career in microbeam analysis can meet and discuss with the established experts. The workshops have a very specific format comprising invited plenary lectures by internationally recognized experts, poster presentations by the participants and round table discussions on the key topics led by specialists in the field. This workshop was organized in collaboration with LNEG - Laboratorio Nacional de Energia e Geologia and SPMICROS - Sociedade Portuguesa de Microscopia. The technical programme included the following topics: electron probe microanalysis, future technologies, electron backscatter diffraction (EBSD), particle analysis, and applications. As at previous workshops there was also a special oral session for young scientists. The best presentation by a young scientist was awarded with an invitation to attend the 2014 Microscopy and Microanalysis meeting at Hartford, Connecticut. The prize went to Shirin Kaboli, of the Department of Metals and Materials Engineering of McGill University (Montreal, Canada), for her talk entitled ''Plastic deformation studies with electron channelling contrast imaging and electron backscattered diffraction''. The continuing relevance of the EMAS workshops and the high regard in which they are held internationally can be seen from the fact that 74 posters from 21 countries were on display at the meeting and that the participants came from as far away as Japan, Canada and the USA. A selection of participants with posters was invited to give a short oral presentation of their work in three dedicated sessions. The prize for the best poster was an invitation to participate in the 22nd Australian Conference on Microscopy and Microanalysis (ACMM 23) at Adelaide, South Australia. The prize was awarded to Pierre Burdet of the EM Group of the Department of Materials Science and Metallurgy of the University of Cambridge (UK), for the poster entitled: ''3D EDS microanalysis by FIB-SEM: advantages of a low take-off angle''. This proceedings volume contains the full texts of 8 of the invited plenary lectures and of 13 papers on related topics originating from the posters presented at the workshop. All the papers have been subjected to peer review by a least two referees. January 2014 Acknowledgements On behalf of the European Microbeam Analysis Society I would like to thank all the invited speakers, session chairs and members of the discussion panels for making the meeting such a great success. Special thanks go to Fernanda Guimaraes and Luc Van't dack who directed the organisation of the workshop giving freely of their time and talents. As was the case for previous workshops, the EMAS board in corpore was responsible for the scientific programme. The Workshop also included a commercial exhibition where many leading instrument suppliers were represented. Several companies that exhibited provided financial support, either by sponsoring an event or by advertising. Below, in alphabetical order, is a list of exhibiting companies and sponsors of the workshop. - Ametek GmbH, Edax Business Unit- IZASA Group Werfen - Bruker Nano GmbH- Jeol (Europe) SAS - Cameca SA- Porto Gran Cruz - Câmara Municipal do Porto- Oxford Instruments NanoAnalysis Ltd. - European Institute for Transuranium Elements (Germany)- Probe Software, Inc. - FEI Company- Tescan, a.s. Michael B Matthews EMAS President
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How this classification was reachedexpand
Full frame machine prediction
Teacher imitationNot calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.
Distilled classifier scores by category (both heads)
| Category | Codex | Gemma |
|---|---|---|
| Metaresearch | 0.007 | 0.004 |
| Meta-epidemiology (narrow) | 0.002 | 0.001 |
| Meta-epidemiology (broad) | 0.001 | 0.002 |
| Bibliometrics | 0.002 | 0.001 |
| Science and technology studies | 0.002 | 0.001 |
| Scholarly communication | 0.006 | 0.004 |
| Open science | 0.003 | 0.006 |
| Research integrity | 0.004 | 0.004 |
| Insufficient payload (model declined to judge) | 0.076 | 0.055 |
Machine scores (provisional)
The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.
Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.
score_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from itClassification
machine, unvalidatedMachine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.
How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".