MétaCan
Menu
Back to cohort
Record W1922915833 · doi:10.1109/icvd.2000.812609

Hierarchical test generation for systems on a chip

2002· article· en· W1922915833 on OpenAlex
R.S. Tupuri, Jacob A. Abraham, D.G. Saab

Why this work is in the frame

A frame that forgets how it found something cannot be audited. These are the routes that admitted this work.

affAt least one author lists a Canadian institution in the pinned OpenAlex snapshot.

Bibliographic record

Venuenot available
Typearticle
Languageen
FieldComputer Science
TopicVLSI and Analog Circuit Testing
Canadian institutionsAdvanced Micro Devices (Canada)
FundersSemiconductor Research Corporation
KeywordsTestabilityDesign for testingAutomatic test pattern generationComputer scienceSystem on a chipEmbedded systemChipLogic synthesisComputer architectureCore (optical fiber)Logic gateReliability engineeringEngineeringElectronic circuitAlgorithm

Abstract

fetched live from OpenAlex

The rapid increase in functionality on a single chip in the last few years has increased the gap between the complexity of the design and the capability of commercial test tools. In particular the test needs for systems on a chip (SOC) are not addressed by existing tools. Because some of the cores integrated on a single SOC may not have embedded testability features, it is not always possible to use conventional design for testability (DFT) methodologies directly. This paper presents a novel approach for generating tests for complex SOCs which targets one module (or core) at a time, by extracting its environment elegantly in the form of constraints and storing it as virtual logic. Information about the core processor and internal bus is used to reduce the size of the virtual logic so that a commercial ATPG tool can be used to generate tests. These tests are then automatically translated to system-level tests. The approach is illustrated with an example SOC based on the picoJava core.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Simulation or modeling · Consensus signal: none
GenreCandidate signal: Empirical · Consensus signal: none
Teacher disagreement score0.996
Threshold uncertainty score0.192

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.076
GPT teacher head0.248
Teacher spread0.172 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Quick stats

Citations8
Published2002
Admission routes1
Has abstractyes

Explore more

Same topicVLSI and Analog Circuit TestingFrench-language works237,207