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Record W1969311468 · doi:10.1063/1.2113415

X-ray photoelectron spectroscopy and structural analysis of amorphous SiOxNy films deposited at low temperatures

2005· article· en· W1969311468 on OpenAlexafffund
P. Cova, S. Poulin, R. A. Masut

Bibliographic record

VenueJournal of Applied Physics · 2005
Typearticle
Languageen
FieldEngineering
TopicThin-Film Transistor Technologies
Canadian institutionsPolytechnique MontréalRegroupement Québécois sur les Matériaux de Pointe
FundersNatural Sciences and Engineering Research Council of CanadaFonds Québécois de la Recherche sur la Nature et les Technologies
KeywordsX-ray photoelectron spectroscopyDangling bondSilicon oxynitrideAnalytical Chemistry (journal)Amorphous solidSiliconMaterials scienceChemical vapor depositionChemistryCrystallographySilicon nitrideNuclear magnetic resonanceNanotechnology

Abstract

fetched live from OpenAlex

We establish, using a tetrahedral model, the bonding properties of amorphous silicon oxynitride (a-SiOxNy) films deposited at low temperatures (LTs) by electron-cyclotron resonance chemical-vapor deposition (ECRCVD) on several substrates and under various conditions of gas flows and total gas pressure in a dilute mixture of SiH4+N2 in Ar. The atomic percentage of each tetrahedral unit incorporated in the film network is calculated from the deconvolution of the high-resolution x-ray photoelectron spectroscopy (XPS) spectra in the Si 2p3∕2 region and corroborated by the results obtained from both survey scans and the high-resolution XPS spectra in the N 1s region. The Si3N4 phase is the most important one and the only bonding unit which is incorporated in all our LT ECRCVD SiOxNy films. The incorporation of all the other component tetrahedrons depends strongly on growth conditions. The threshold values of the N∕Si atomic ratio for which intrinsic defects, such as Si–Si bonds, are not incorporated in the network depend on the O∕Si ratio incorporated in the films, mainly due to the competition between oxygen and nitrogen atoms in their reaction with silicon dangling bonds. The effect of the total gas pressure on the atomic percentages of the oxidation states present in the LT ECRCVD SiOxNy films is qualitatively similar to the effect of the ion bombarding energy or the plasma density. O–N bonds are present only in samples having high amount of oxygen and nitrogen in their networks. For these films, our results show unambiguously the presence of the N–Si2O tetrahedron and suggest that N–Si3−νOν tetrahedrons with ν⩾2 are not incorporated in their networks. A correlation is observed between the N–Si2O and the Si–O3(ON) tetrahedrons whose component peak is localized at (104.0±0.2)eV in the Si 2p3∕2 region of the XPS data, which suggests that both bonding units coexist in these films as some sort of complex bonding configuration.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.236
Threshold uncertainty score0.747

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0010.000
Bibliometrics0.0000.001
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.003
GPT teacher head0.193
Teacher spread0.190 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations12
Published2005
Admission routes2
Has abstractyes

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