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Record W2011413832 · doi:10.1116/1.1520551

Electrical conductivity of sidewall-deposited fluorocarbon polymer in SiO2 etching processes

2002· article· en· W2011413832 on OpenAlexaff
Tadashi Shimmura, S. Soda, Seiji Samukawa, Mitsumasa Koyanagi, Kazuhiro Hane

Bibliographic record

VenueJournal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2002
Typearticle
Languageen
FieldEngineering
TopicPlasma Diagnostics and Applications
Canadian institutionsHatch (Canada)
Fundersnot available
KeywordsFluorocarbonEtching (microfabrication)Materials scienceWaferFabricationConductivityElectrical contactsSiliconDry etchingReactive-ion etchingContact resistanceOptoelectronicsPolymerNanotechnologyComposite materialChemistryLayer (electronics)

Abstract

fetched live from OpenAlex

High-aspect-ratio SiO2 contact hole etching is one of the key processes in the fabrication of ultralarge scale integration devices. However, there are many serious problems, such as charge-build-up damage, etching-stop, and microloading effects. Charge accumulation in high-aspect-ratio contact holes during etching is one of the main causes of these problems. In SiO2 etching using fluorocarbon gases, it is well known that a fluorocarbon film is deposited on the underlayer surface and sidewall of contact holes. It is also predicted that an increase in the conductivity of the fluorocarbon film deposited on the SiO2 sidewall markedly reduces the charging potential in the high-aspect-ratio contact holes because of the high conductivity of the deposited polymer. To clarify these phenomena, it is necessary to obtain quantitative measurements of the conductivity of the sidewall surfaces in contact holes. Therefore, we fabricated the sensing device using semiconductor production technology, and monitored sidewall current of SiO2 contact holes on the silicon wafer. The relationship between the chemical structure and sidewall current of the fluorocarbon films deposited in contact holes is investigated. We have found that highly cross-linked and unsaturated fluorocarbon polymer causes high sidewall conductivity in SiO2 contact holes. It is suggested that the deposited fluorocarbon film reduces the charging potential during the SiO2 etching process.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.033
Threshold uncertainty score0.609

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0010.002
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.014
GPT teacher head0.206
Teacher spread0.192 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations16
Published2002
Admission routes1
Has abstractyes

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Same venueJournal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and PhenomenaSame topicPlasma Diagnostics and ApplicationsFrench-language works237,207