MétaCan
Menu
Back to cohort
Record W2081445686 · doi:10.1115/imece2010-38400

On-Chip Structures for the Determination of the Dopant-Dependent Young’s Modulus of Heavily Phosphorus Doped Polysilicon With Stress Compensation

2010· article· en· W2081445686 on OpenAlexaff
Elena Bassiachvili, J. R. Godin, Patricia Nieva, Amir Khajepour

Bibliographic record

Venuenot available
Typearticle
Languageen
FieldEngineering
TopicAdvanced MEMS and NEMS Technologies
Canadian institutionsUniversity of Waterloo
Fundersnot available
KeywordsMaterials scienceMicroelectromechanical systemsWaferModulusFabricationPolysilicon depletion effectCantileverOptoelectronicsDopingDopantStress (linguistics)Young's modulusThin filmChipComposite materialVoltageElectronic engineeringElectrical engineeringNanotechnologyTransistor

Abstract

fetched live from OpenAlex

Accurate knowledge of thin-film material properties, such as Young’s modulus, is imperative in proper design and operation of MEMS devices. The use of on-chip devices allows direct access to the material properties as they are known to change with fabrication process, temperature as well as location within the wafer. Resonant and pull-in structures have been designed and modeled for the measurement of the Young’s modulus of heavily doped polysilicon thin films. The cantilever and clamped-clamped beams allow us to extract the Young’s modulus through observing the resonant frequency and pull-in voltage and cross-referencing the results. Mechanical actuation using a calibrated piezoelectric shaker for some devices and electrostatic actuation for others ensures that the structural effects, rather than the actuation technique, are responsible for the varying response at different temperatures. Optical readout will be used in order to reduce readout-associated errors, which can occur with purely electrical techniques at higher temperatures. However, electrical readout is also possible for some of the devices. The devices have been designed and fabricated using a customized 1-mask process. In this paper, we present the modeling and numerical simulations obtained for heavily doped polysilicon microstructures and will describe the method used for the determination of the Young’s modulus with stress compensation. Although the method described here has been used for heavily doped polysilicon thin films, it can be easily modified for the determination of Young’s modulus of other MEMS structural materials.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.002
Threshold uncertainty score0.007

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0020.001

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.007
GPT teacher head0.220
Teacher spread0.212 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations1
Published2010
Admission routes1
Has abstractyes

Explore more

Same topicAdvanced MEMS and NEMS TechnologiesFrench-language works237,207