Design techniques for gate-leakage reduction in CMOS circuits
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Bibliographic record
Abstract
Oxide tunneling current in MOS transistors is fast becoming a non-negligible component of power consumption, as gate oxides get thinner, and could become in the future the dominant leakage mechanism in sub-100 nm CMOS circuits. In this paper, we present an analysis of static CMOS circuits from a gate-leakage point of view. We first consider the dependence of the gate current on various conditions for a single transistor and identify 3 main regions in which a MOS transistor will operate between clock transitions. The amount of gate-current differs by several orders of magnitude from one region to another. Whether a transistor will leak significantly or not is determined by its position in relation to other transistors within a structure. By comparing logically equivalent but structurally different CMOS circuits, we find that the gate current exhibits a 'structure dependence'. Also, the total gate-leakage in a given structure varies significantly for different combinations of inputs, from which we derive "state-dependent gate-leakage tables" that can be used to estimate the total amount of gate-current for a large circuit. Finally, we suggest guidelines aimed at reducing the amount of oxide-leakage current based on the presented structure and state dependencies.
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Full frame distilled prediction
Teacher imitationNot calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.
Codex and Gemma teacher scores by category
| Category | Codex | Gemma |
|---|---|---|
| Metaresearch | 0.000 | 0.000 |
| Meta-epidemiology (narrow) | 0.000 | 0.000 |
| Meta-epidemiology (broad) | 0.000 | 0.000 |
| Bibliometrics | 0.000 | 0.000 |
| Science and technology studies | 0.000 | 0.000 |
| Scholarly communication | 0.000 | 0.000 |
| Open science | 0.000 | 0.000 |
| Research integrity | 0.000 | 0.000 |
| Insufficient payload (model declined to judge) | 0.000 | 0.000 |
Machine scores (provisional)
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Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.
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