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Record W2159280030 · doi:10.1109/ectc.1995.517850

An investigation of conductive polymer flip chip attachment in multichip module applications

2002· article· en· W2159280030 on OpenAlexaboutno aff
Charlie Howard, Suresh Nair, Simon S. Ang, L.W. Schaper

Bibliographic record

Venuenot available
Typearticle
Languageen
FieldEngineering
TopicElectronic Packaging and Soldering Technologies
Canadian institutionsnot available
Fundersnot available
KeywordsFlip chipInterconnectionReliability (semiconductor)SolderingDie (integrated circuit)ChipElectrical conductorIntegrated circuit packagingSubstrate (aquarium)Thermal copper pillar bumpMaterials scienceComputer scienceElectronic engineeringEngineeringMechanical engineeringNanotechnologyLayer (electronics)Composite materialTelecommunications

Abstract

fetched live from OpenAlex

Conventional flip chip solder bump technology is being confronted by the need to remove lead content and eliminate CFC containing solvents by the year 2000, as mandated by the Montreal Protocol. In addition, this process can be expensive, involves complex manufacturing sequences, and is susceptible to failure due to fatigue. Electrically conductive polymers have the potential for solder replacement in chip-to-substrate level interconnection. The scope of the project involves selection, evaluation, and comparison of candidate materials for low cost multichip module(MCM) applications. This paper discusses the design, processing, and assembly of an MCM test vehicle, developed at the University of Arkansas, which can incorporate various flip chip interconnection materials. An evaluation of two commercially-available, silver-based epoxies is being performed. The test vehicle is used to investigate possible reliability problems, as well as for comparison of the various interconnection materials. Interconnect failure identification is accomplished through continuously monitoring daisy chains which provide paths from substrate to chip. Environmental stresses can be effectively used to accelerate failure mechanisms and prove device reliability under real operating conditions. Mechanical tests including die pull-off and die shear can be performed to determine bond strength. This paper describes testing procedures used, in conjunction with the developed test vehicle, to compare and evaluate interconnection material performance and reliability. Preliminary testing results are also presented.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.222
Threshold uncertainty score0.311

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.023
GPT teacher head0.243
Teacher spread0.220 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations9
Published2002
Admission routes1
Has abstractyes

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