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Plasma FIB DualBeam Delayering for Atomic Force NanoProbing of 14 nm FinFET Devices in an SRAM Array

2015· article· en· W2314077839 on OpenAlexaff
Roger Alvis, Trevan Landin, Chad Rue, Peter Carleson, O.Yu. Sidorov, Andrew Erickson, Sean Zumwalt, Sinjin Dixon-Warren, Wanyi Liu, Shih‐Hsin Chang, Te-Fu Chang, Chia-Hsiang Yen, Pau-Sheng Kuo, Chih-Hsun Chu

Bibliographic record

VenueProceedings - International Symposium for Testing and Failure Analysis · 2015
Typearticle
Languageen
FieldEngineering
TopicIntegrated Circuits and Semiconductor Failure Analysis
Canadian institutionsChipworks (Canada)Mediprobe Research (Canada)
Fundersnot available
KeywordsMaterials scienceFlatness (cosmology)Nanoscopic scaleStatic random-access memoryPlasmaOptoelectronicsElectrical conductorVoltageConductive atomic force microscopyNano-ConductivityAtomic force microscopyNanotechnologyAnalytical Chemistry (journal)Electrical engineeringComposite materialChemistryEngineering

Abstract

fetched live from OpenAlex

Abstract The result of applying normal xenon ion beam milling combined with patented DX chemistry to delayer state-of-theart commercial-grade 14nm finFETs has been demonstrated in a Helios Plasma FIB DualBeam™. AFM, Conductive-AFM and nano-probing with the Hyperion Atomic Force nanoProber™ were used to confirm the capability of the Helios PFIB DualBeam to delayer samples from metal-6 down to metal-0/local interconnect layer and in under two hours produce a sample that is compatible with the fault isolation, redetection, and characterization capabilities of the AFP. IV (current-voltage) curves were obtained from representative metal-0 contacts exposed by the PFIB+DX delayering process and no degradation to device parameters was uncovered in the experiments that were run. Compared to mechanically delayering samples, the many benefits of using the PFIB+DX process to delayer samples for nano-probing were conclusively demonstrated. Such benefits, include sitespecificity, precise control over the amount of material removed, >100μm square DUT (device under test) area, nm-scale flatness over the DUT area, nm-scale topography between contacts and the surrounding ILD, uniform conductivity across the DUT area, all with no obvious detrimental effects on typical DC device parameters measured by nano-probing.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.002
Threshold uncertainty score0.007

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0020.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.023
GPT teacher head0.244
Teacher spread0.221 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

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Citations8
Published2015
Admission routes1
Has abstractyes

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