MétaCan
Menu
Back to cohort
Record W2511447396 · doi:10.1109/ectc.2016.57

Chip Rework on Ceramic and Organic Modules

2016· article· en· W2511447396 on OpenAlexaff
Richard N. Langlois, Christian Bergeron

Bibliographic record

Venuenot available
Typearticle
Languageen
FieldEngineering
TopicElectronic Packaging and Soldering Technologies
Canadian institutionsIBM (Canada)
Fundersnot available
KeywordsReworkSolderingSolder pasteMaterials scienceCeramicFlip chipChipMetallurgyComputer scienceComposite materialEngineeringElectrical engineeringEmbedded systemAdhesiveLayer (electronics)

Abstract

fetched live from OpenAlex

This paper reviews the development of chip rework processes at IBM, from leaded bumps on ceramics to lead-free on organic carriers, with emphasis on the latter. Traditionally, when fabricating high performance multichip ceramic modules, the ability to remove one or several chips after testing the fully populated module becomes important in ensuring that it has a full complement of functioning chips. Such a rework procedure has been developed and practiced for years on dies with leaded C4s (Controlled Collapse Chip Connection). It involves removing a die by reflow, before underfilling, and dressing the site using a porous copper block, first soldered and then sheared at room temperature. Later, in an effort to qualify the transition to lead-free solder bumps on ceramic carriers, it became clear that the rework process needed an important modification of the dressing step. Because of the higher stiffness of the Pb-free solder, the usual room temperature shearing of the copper block induced damage to the bonding pads and vias. This led to the development of a hot copper block process that solved this problem, although lead-free did not get qualified on ceramics for other reasons. This improved process was later investigated for reworking bad dies on organic carriers. However, the good performance of the dressing process at removing residual solder was such that on many pads, the solder surface ended below the level of the solder mask thus giving rise to many open connections when joining a new device. This motivated the search for a process that would leave solder residues, after the bad die removal, that would not only be above the solder mask, but also sufficiently uniform to join a new die successfully. Such a modified bare die removal process was developed, without any site dressing being required. Dies 8.5 X 8.5 mm were successfully replaced on a 4-up 55 mm TV carrier, one or two at a time, with passenger dies being underfilled or not before rework. Reliability stressing, DTC 1000 cycles and HTS 1000 h, completed without degradation. Reworking larger dies (17.7 X 17.7 mm) was also demonstrated, with the process being extended to even larger form factor above 20 mm.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.351
Threshold uncertainty score0.180

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.006
GPT teacher head0.181
Teacher spread0.174 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations3
Published2016
Admission routes1
Has abstractyes

Explore more

Same topicElectronic Packaging and Soldering TechnologiesFrench-language works237,207