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Physical and Electrical Performance Comparison of Identical 28 nm Qualcomm Telecommunication Die Produced by Samsung and TSMC

2013· article· en· W2525018093 on OpenAlexaff
Anton Riley, Sean Zumwalt, Sinjin Dixon-Warren, G. Tomkins

Bibliographic record

VenueProceedings - International Symposium for Testing and Failure Analysis · 2013
Typearticle
Languageen
FieldEngineering
TopicIntegrated Circuits and Semiconductor Failure Analysis
Canadian institutionsChipworks (Canada)
Fundersnot available
KeywordsDie (integrated circuit)Static random-access memoryCharacterization (materials science)Computer scienceCompetition (biology)Product (mathematics)Manufacturing engineeringTelecommunicationsElectrical engineeringMaterials scienceEngineeringMechanical engineeringNanotechnology

Abstract

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Abstract In today’s competitive semiconductor environment, product performance and market timing has never been more valuable. Design IP, speed to market, and taking advantage of the most advanced technology are three ways fabless companies can maintain an advantage over the competition. Foundries target these demands by offering superior support, competitive technology, and rapid development cycles. Using the advanced tool suites of SEM, FIB, TEM, and Atomic Force NanoProbing (AFP) the failure analysis community now has the ability to investigate and compare foundry performance on the device level. The 28 nm LP Qualcomm “SHELBY” die is dual-sourced from both Samsung and TSMC, and is the primary die in the MDM9215 4G/LTE modem used in several smartphones. This represents a unique case of leading technology, available to the public, to qualify for electrical performance on the device level using the AFP and the corresponding physical differences using SEM and TEM. These advanced FA techniques were employed and were able to identify manufacturing differences between foundries. They were then used to relate the physical variations with the electrical device performance. The HG11-N3877 fabricated by TSMC and the HG11-N9204 fabricated by Samsung were the subjects of this comparison (see Error! Reference source not found.). The investigation located spatial and geometric variations of the SRAM devices using cross sectioning and TEM imaging. This was followed by Electrical Characterization of multiple SRAM Cells using the AFP. The electrical measurements showed clear differences in device parameters. These differences highlight manufacturing process differences between the two companies that could directly relate to chip performance.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Simulation or modeling · Consensus signal: none
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.961
Threshold uncertainty score0.785

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.001
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.012
GPT teacher head0.245
Teacher spread0.233 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designSimulation or modeling
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

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Citations1
Published2013
Admission routes1
Has abstractyes

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