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Record W2540054844 · doi:10.1109/idt.2011.6123104

An electrical-aware parametric DFM solution for analog circuits

2011· article· en· W2540054844 on OpenAlexaff
Rami Fathy, Ahmed Arafa, Sherif Hany, Abdelrahman ElMously, Haitham Eissa, Mohamed Dessouky, David Nairn, Mohab Anis

Bibliographic record

Venuenot available
Typearticle
Languageen
FieldEngineering
TopicAdvancements in Semiconductor Devices and Circuit Design
Canadian institutionsUniversity of Waterloo
Fundersnot available
KeywordsDesign for manufacturabilityParametric statisticsComputer scienceElectronic circuitAnalogue electronicsElectronic engineeringElectrical engineeringEngineering

Abstract

fetched live from OpenAlex

Today, many of the approaches that are commonly referred to as physical DFM techniques only address catastrophic defects and systematic process variations. These techniques include spreading wires, doubling vias, identification of critical areas in the circuit that are especially susceptible to defects, and identification of proximity effects caused by the lithography process. However, physical DFM tools are purely “geometric”, in that they work to preserve shape fidelity without any knowledge of the impact on the electrical characteristics of the shapes that are manufactured in silicon. While these techniques have proven useful in reducing functional failures and increasing overall yield by a few percentage points, they completely ignore the more important category of parametric failures. The proposed solution presented in this chapter specifically helps to address the parametric performance modeling problems encountered at smaller geometries. As this solution drives design requirements into physical layout design and moves layout awareness upstream into design, useful information about the design (on the physical and electrical level) is captured, analyzed, and simulated. Deviations in the electrical characteristics due to physical layout and process variations, are identified and highlighted on the design. These deviations are referred as electrical hotspots (e-hotspots). To validate this work, The proposed e-hotspot detection engine is verified against silicon wafer data for a level shifter circuit designed at 130nm. The e-hotspot devices with high variation in DC current and causing parametric failure, are identified.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.001
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: none
GenreCandidate signal: Methods · Consensus signal: Methods
Teacher disagreement score0.003
Threshold uncertainty score0.011

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.001
Meta-epidemiology (narrow)0.0010.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.001
Open science0.0010.001
Research integrity0.0010.001
Insufficient payload (model declined to judge)0.0030.001

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.060
GPT teacher head0.262
Teacher spread0.202 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreMethods

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

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Citations0
Published2011
Admission routes1
Has abstractyes

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Same topicAdvancements in Semiconductor Devices and Circuit DesignFrench-language works237,207