Impact of SiO<inf>2</inf>/Si interface micro-roughness on SILC distribution and dielectric breakdown: A comparative study with atomically flattened devices
Bibliographic record
Abstract
Stress Induced Leakage Current (SILC) limits the scaling of tunnel oxide of flash memory, because it increases with the decrease of the tunnel oxide thickness. Especially, anomalously large SILC that appears on the local spots can cause bit errors. We measured Qbdand SILC characteristics of the MOSFETs with the conventional and the atomically flattened SiO2/Si interfaces, and the impact of the micro-roughness on Qbdand SILC has been investigated. It was found that both the numbers of the defects inducing Qbdand anomalous SILC are reduced by introducing the atomically flat SiO2/Si interface. And the calculated excess electric field at a projecting part is approximately 5% larger than the atomically flat part by the SILC distribution and the electric field concentration simulation. It indicates that the SiO2/Si interface micro-roughness is one of the origins that induce both the anomalous SILC and early failure in dielectric breakdown, due to localized electric field concentration effect.
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How this classification was reachedexpand
Full frame machine prediction
Teacher imitationNot calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.
Distilled classifier scores by category (both heads)
| Category | Codex | Gemma |
|---|---|---|
| Metaresearch | 0.000 | 0.001 |
| Meta-epidemiology (narrow) | 0.000 | 0.000 |
| Meta-epidemiology (broad) | 0.000 | 0.000 |
| Bibliometrics | 0.000 | 0.000 |
| Science and technology studies | 0.000 | 0.000 |
| Scholarly communication | 0.000 | 0.000 |
| Open science | 0.000 | 0.000 |
| Research integrity | 0.000 | 0.000 |
| Insufficient payload (model declined to judge) | 0.001 | 0.000 |
Machine scores (provisional)
The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.
Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.
score_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from itClassification
machine, unvalidatedMachine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.
How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".