Chemical imaging of oxide confinement layers in <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:mrow> <mml:mtext>GaAs</mml:mtext> </mml:mrow> <mml:mrow> <mml:mo>/</mml:mo> </mml:mrow> <mml:msub> <mml:mrow> <mml:mtext>Al</mml:mtext> </mml:mrow> <mml:mrow> <mml:mi>x</mml:mi> </mml:mrow> </mml:msub> <mml:msub> <mml:mrow> <mml:mtext>Ga</mml:mtext> </mml:mrow> <mml:mrow> <mml:mn>1</mml:mn> <mml:mo>−</mml:mo> <mml:mi>x</mml:mi> </mml:mrow> </mml:msub> <mml:mrow> <mml:mtext>As</mml:mtext> </mml:mrow> </mml:math> VCSELs
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Bibliographic record
Abstract
Abstract The authors have studied the lateral oxidation of <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:msub> <mml:mrow> <mml:mtext>Al</mml:mtext> </mml:mrow> <mml:mrow> <mml:mi>x</mml:mi> </mml:mrow> </mml:msub> <mml:msub> <mml:mrow> <mml:mtext>Ga</mml:mtext> </mml:mrow> <mml:mrow> <mml:mn>1</mml:mn> <mml:mo>−</mml:mo> <mml:mi>x</mml:mi> </mml:mrow> </mml:msub> <mml:mrow> <mml:mtext>As</mml:mtext> </mml:mrow> </mml:math> layers buried in vertical-cavity surface-emitting lasers using cross-sectional scanning transmission electron microscopy coupled with electron energy loss spectroscopy. Chemical maps and composition profiles of the oxidized AlO x layers have been produced. The sensitivity is such that trace compositions of a few % As and Ga can be detected in the AlO x with a spatial resolution of a few nanometers on the recorded chemical maps. To demonstrate the performance of the mapping technique, we compare results from an area in the vertical-cavity surface-emitting laser (VCSEL) which is pure <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:msub> <mml:mrow> <mml:mtext>Al</mml:mtext> </mml:mrow> <mml:mrow> <mml:mi>x</mml:mi> </mml:mrow> </mml:msub> <mml:msub> <mml:mrow> <mml:mtext>Ga</mml:mtext> </mml:mrow> <mml:mrow> <mml:mn>1</mml:mn> <mml:mo>−</mml:mo> <mml:mi>x</mml:mi> </mml:mrow> </mml:msub> <mml:mrow> <mml:mtext>As</mml:mtext> </mml:mrow> </mml:math> to an oxidized area. These measurements are performed on a thin sample prepared by the focused ion beam technique within an actual VCSEL, which makes the mapping technique applicable for degradation investigations in devices at different stages of their lifetime. More generally, this measurement method is effective for detailed evaluation of AlO x layers and their fabrication process.
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Full frame distilled prediction
Teacher imitationNot calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.
Codex and Gemma teacher scores by category
| Category | Codex | Gemma |
|---|---|---|
| Metaresearch | 0.010 | 0.008 |
| Meta-epidemiology (narrow) | 0.005 | 0.010 |
| Meta-epidemiology (broad) | 0.002 | 0.007 |
| Bibliometrics | 0.005 | 0.010 |
| Science and technology studies | 0.007 | 0.013 |
| Scholarly communication | 0.006 | 0.008 |
| Open science | 0.013 | 0.012 |
| Research integrity | 0.011 | 0.010 |
| Insufficient payload (model declined to judge) | 0.849 | 0.006 |
Machine scores (provisional)
The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.
Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.
score_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it