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Record W4327706641 · doi:10.1116/6.0002339

Plasma induced damage on AlGaN/GaN heterostructure during gate opening for power devices

2023· article· en· W4327706641 on OpenAlexafffund
Oleh Fesiienko, Camille Petit-Étienne, Maxime Darnon, A. Soltani, Hassan Maher, E. Pargon

Bibliographic record

VenueJournal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2023
Typearticle
Languageen
FieldPhysics and Astronomy
TopicGaN-based semiconductor devices and materials
Canadian institutionsInstitut interdisciplinaire d'innovation technologiqueUniversité de Sherbrooke
FundersCentre National de la Recherche ScientifiqueInstitut National des Sciences Appliquées de LyonFonds de recherche du Québec – Nature et technologiesUniversité Grenoble AlpesUniversité de SherbrookeIndian National Science Academy
KeywordsMaterials scienceHeterojunctionOptoelectronicsX-ray photoelectron spectroscopyEtching (microfabrication)Barrier layerReactive-ion etchingPlasmaWide-bandgap semiconductorTransmission electron microscopyAnalytical Chemistry (journal)Layer (electronics)NanotechnologyChemistryChemical engineering

Abstract

fetched live from OpenAlex

During the fabrication of metal oxide semiconductor high electron mobility transistor based on AlGaN/GaN heterostructure, gate patterning is recognized as the most critical step that can lead to electrical degradation of the transistor. In this work, we performed the SiN cap layer plasma etching processes by two fluorine-based plasma processes (SF6/Ar and CHF3/CF4/Ar) with low (≈15 eV) and high (≈260 eV) ion energies. Moreover, we investigate the postetching treatment using a KOH solution in order to restore the quality of the AlGaN barrier surface after etching. The objective of this article is to evaluate the AlGaN barrier surface damage after the listed plasma etching processes and postetching strategies by using quasi-in situ angle-resolved x-ray photoelectron spectroscopy, transmission electron microscopy, and atomic force microscope. Accordingly, it is found that both high ion energy plasma processes lead to a significant stoichiometric change and modification of the AlGaN barrier layer into a 1.5 nm F-rich AlGaNFx subsurface reactive layer. The decrease in ionic energy leads to a decrease in the SiN etch rate and a significant improvement in the SiN/AlGaN etch selectivity (which becomes infinite) for both plasma chemistries. Moreover, the decrease in ion energy decreases the depth of the modification (about 0.5 nm) and reduces the stochiometric change of the AlGaN barrier layer. However, both low and high ion energy SF6/Ar plasma lead to 0.8 eV Fermi level shift toward the valence band. Furthermore, the KOH postetching treatment demonstrates complete and effective removal of the AlGaNFx subsurface reactive layer and restoration of the surface properties of the AlGaN layer. However, this removal leads to AlGaN recesses that are correlated to the thickness of the reactive layer formed during the etching.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.001
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.033
Threshold uncertainty score0.872

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0010.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0010.001
Science and technology studies0.0010.000
Scholarly communication0.0000.001
Open science0.0010.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.015
GPT teacher head0.273
Teacher spread0.258 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations14
Published2023
Admission routes2
Has abstractyes

Explore more

Same venueJournal of Vacuum Science & Technology A Vacuum Surfaces and FilmsSame topicGaN-based semiconductor devices and materialsFrench-language works237,207