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EOTPR Fine Pitch Probing for Die-to-Die Interconnect Failure Analysis

2025· article· W4415990515 on OpenAlexaff
Bernice Zee, Wen Qiu, Aaron Wai Ken Lee, Jesse Alton, Thomas P. White, David D. Kim, Martin Igarashi

Bibliographic record

VenueProceedings - International Symposium for Testing and Failure Analysis · 2025
Typearticle
Language
FieldEngineering
TopicIntegrated Circuits and Semiconductor Failure Analysis
Canadian institutionsAdvanced Micro Devices (Canada)
FundersAdvanced Micro Devices
KeywordsInterconnectionRoot causeGranularityFault detection and isolationIsolation (microbiology)TRACE (psycholinguistics)Integrated circuit packagingCatastrophic failureFault (geology)

Abstract

fetched live from OpenAlex

Abstract Debug and physical failure analysis (PFA) of heterogeneously integrated semiconductor packages, particularly die-to-die (D2D) input/output (I/O) type fails, has become very challenging due to the lack of direct access to the I/Os from the package substrate to do static open/shorts fault isolation and limited test program granularity to determine which location along the D2D interconnect trace is failing. Thus, a suitable electrical fault isolation technique is required to ensure high success rate for root cause analysis. This paper discusses how EOTPR is used to isolate defects on a D2D interconnect trace of a chiplet advanced packaging using local silicon bridge with reasonable accuracy. Minimal sample preparation was needed to expose the I/O bumps for probing, thus minimizing the risk of artifacts that may cause the defect to be lost. A case study will demonstrate the successful application of the technique.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.001
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.002
Threshold uncertainty score0.006

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.001
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0020.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.013
GPT teacher head0.248
Teacher spread0.236 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations0
Published2025
Admission routes1
Has abstractyes

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Same venueProceedings - International Symposium for Testing and Failure AnalysisSame topicIntegrated Circuits and Semiconductor Failure AnalysisFrench-language works237,207