MétaCan
Menu
Back to cohort
Record W4416885326 · doi:10.37665/srvjfxj77828

Mechanistic-Based Reliability Evaluation of FC-PBGA Under Thermal and Flexural Loading

2010· article· W4416885326 on OpenAlexaff
Alireza Sahami Shirazi, Hua Lu, A. Varvani‐Farahani

Bibliographic record

VenueSoldering and Reliability Conferences · 2010
Typearticle
Language
FieldEngineering
TopicElectronic Packaging and Soldering Technologies
Canadian institutionsToronto Metropolitan University
Fundersnot available
KeywordsBall grid arrayFlip chipThermalPrinted circuit boardThermal expansionDeflection (physics)SolderingReliability (semiconductor)Flexural strengthMaterial properties

Abstract

fetched live from OpenAlex

ABSTRACT Thermal and mechanical behavior of a flip chip plastic ball grid array (FC-PBGA) assembly may be investigated with analytical methods. This paper presents new analytical solutions for the evaluation of thermal warpage, mechanical deflection and interfacial stresses-strains in adhesively bonded trilayer structures including assemblies and its constituents such as the IC (Integrated Circuit) chip, substrate laminate, printed circuit board (PCB), underfill layer and board level solder joints. It is a challenging task to obtain internal interfacial stresses-strains in a package experimentally, yet these parameters are essential to the understanding and improvement of the reliability of individual layers and the entire package. The new analytical solutions are developed with less restriction as compared with those of the existing analytical models, thus giving enhanced accuracy to such evaluation if the materials thermal and mechanical properties are known and certain. Furthermore, this paper presents a novel hybrid experimental-analytical inverse method (HEAIM) that is formulated based on the above analytical structure models. With experimentally measured global structural deformation of a package subjected to a thermal cycle, HEAIM is capable of inversely evaluate and characterize the thermal properties and the temperature dependent constitutive behavior for individual layers of the package. Both analytical model and inverse method as proposed can provide pertinent guidance to design for reliability of complex layered structures at different levels of packaging, such as the modules, substrates, PCBs and board-level assemblies, etc.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.001
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.001
Threshold uncertainty score0.002

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.001
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0010.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.027
GPT teacher head0.269
Teacher spread0.242 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations0
Published2010
Admission routes1
Has abstractyes

Explore more

Same venueSoldering and Reliability ConferencesSame topicElectronic Packaging and Soldering TechnologiesFrench-language works237,207