MétaCan
Menu
Back to cohort
Record W1989547031 · doi:10.1117/12.718185

Successful MWIR FPA fabrication using gas cluster ion-beam InSb surface finishing

2007· article· en· W1989547031 on OpenAlexaff
L.P. Allen, G. Dallas, K. Blanchet, Shivashankar Vangala, C. Santeufemio, W. D. Goodhue, E. Roehl, C. E. Jones, J.B. Barton, Barry M. Zide, Vincent DiFilippo, K. S. Jones

Bibliographic record

VenueProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007
Typearticle
Languageen
FieldEngineering
TopicAdvanced Semiconductor Detectors and Materials
Canadian institutionsLockheed Martin (Canada)
Fundersnot available
KeywordsMaterials scienceOptoelectronicsFabricationEtching (microfabrication)Focused ion beamOpticsNanotechnologyIonChemistryLayer (electronics)Physics

Abstract

fetched live from OpenAlex

As the demand for mid wavelength infrared (MWIR) focal plane arrays (FPAs) continues to increase, the quality of InSb surfaces becomes more stringent. State-of-the art InSb contains <20 etch pits/cm2 (EPD), and provides a surface suitable for rapid oxide desorption and high quality MBE growth. In order to satisfy resolution and sensitivity requirements for advanced MWIR FPA imaging systems ( 1 to 5.4 μm region @77°K), the surface and sub-surface of the material must be of excellent quality. CMP has proven to be a qualified finishing process for InSb surfaces in the fabrication of IRFPAs. However, a time consuming surface etch is universally required in the IRFPA manufacturing process. Gas cluster ion beam processing (GCIB) has been shown to significantly enhance the surface oxide desorption of both GaSb and InSb substrates for MBE growth and provides an alternate surface finish for IRFPA manufacturing. The use of GCIB may preclude the need for surface etching, thus reducing IRFPA processing time and chemical cleanup. This study examines the comparison of CMP and GCIB finishes on InSb surfaces and the effect on final IRFPA device pass rates. NF3/O2 dual energy GCIB surface processing was used in this study. Atomic force microscopy (AFM), cross-section transmission electron microscopy (XTEM), and rocking curve x-ray diffraction (XRD) examine the surface and subsurface InSb integrity. A comparison of pass-rates for completed IRFPAs with the CMP and GCIB surface shows the pass-rate to be the same, opening the possibility for etch step elimination.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.001
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.002
Threshold uncertainty score0.004

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.001
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0010.000
Scholarly communication0.0000.000
Open science0.0010.000
Research integrity0.0010.000
Insufficient payload (model declined to judge)0.0010.001

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.013
GPT teacher head0.239
Teacher spread0.226 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations1
Published2007
Admission routes1
Has abstractyes

Explore more

Same venueProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIESame topicAdvanced Semiconductor Detectors and MaterialsFrench-language works237,207