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Record W2031816655 · doi:10.1080/10584580215402

An Effective Interlayer Dielectric and Passivation Scheme Using Reactively Sputtered AL 2 O 3 for (Ba,Sr)TiO 3 Capacitors

2002· article· en· W2031816655 on OpenAlex
A. Kassam, Ivoyl P. Koutsaroff, L. E. McNeil, Jacob A. Obeng, Patrick C. Y. Woo, M. Zelner

Why this work is in the frame

A frame that forgets how it found something cannot be audited. These are the routes that admitted this work.

affAt least one author lists a Canadian institution in the pinned OpenAlex snapshot.

Bibliographic record

VenueIntegrated ferroelectrics · 2002
Typearticle
Languageen
FieldEngineering
TopicSemiconductor materials and devices
Canadian institutionsFraser Health
Fundersnot available
KeywordsPassivationMaterials scienceCapacitorDielectricFabricationAnnealing (glass)OptoelectronicsThin filmSiliconBarrier layerSputteringLayer (electronics)Electronic engineeringNanotechnologyComposite materialElectrical engineeringVoltage

Abstract

fetched live from OpenAlex

Interlayer dielectric and passivation layers for BST capacitors are often very hydrogen rich as a result of the by-products generated during the fabrication process. This hydrogen is well known to significantly degrade the leakage characteristics of the underlying BST capacitors. [1] While it is possible to focus on modifying interlayer dielectric (ILD) or passivation processes to minimize hydrogen exposure, it is preferable to maintain standard process modules available in silicon fabrication lines for case of manufacturing. However, post-deposition annealing is frequently required to reduce the effects of hydrogen, which may migrate into the capacitor during these deposition processes. It is known that Al 2 O 3 films provide an effective barrier to hydrogen migration, even at high temperatures. This paper discusses the integration of a reactively sputtered Al 2 O 3 barrier layer into the interlayer dielectric and passivation process flows of BST thin film capacitors to reduce device degradation during backend processing. Reactively sputtered Al 2 O 3 films were integrated into the production ILD process flow for BST thin film capacitors. Results indicate significant reduction in the post-deposition annealing time is possible while maintaining stable I-V characteristics on the finished devices. The barrier layer can also be etched by standard RIE tools used to etch other common oxides in silicon processing. Aggressive backend passivation schemes were also evaluated to determine the process window available for robust backend integration.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesMeta-epidemiology (narrow)
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: none
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.653
Threshold uncertainty score1.000

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.001
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.027
GPT teacher head0.248
Teacher spread0.222 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it