MétaCan
Menu
Back to cohort
Record W2276491288 · doi:10.1149/06604.0161ecst

(Invited) Plasma Processes for Emerging Silicon-Based MEMS, NEMS and Packaging Applications

2015· article· en· W2276491288 on OpenAlexaff
Mark E. McNie

Bibliographic record

VenueECS Transactions · 2015
Typearticle
Languageen
FieldEngineering
TopicNanofabrication and Lithography Techniques
Canadian institutionsOxford Instruments (Canada)
FundersLawrence Berkeley National Laboratory
KeywordsNanoelectromechanical systemsMicroelectromechanical systemsMaterials scienceNanotechnologyWaferAtomic layer depositionSiliconLithographyEtching (microfabrication)Plasma-enhanced chemical vapor depositionChemical vapor depositionOptoelectronicsLayer (electronics)

Abstract

fetched live from OpenAlex

Plasma processes are important for emerging silicon-based micro-electro-mechanical systems (MEMS), nano-electro-mechanical systems (NEMS) and packaging applications. Typically every device has a customised process flow but synergies can be found as most are produced using a 2.5D approach comprising sequential deposition, lithography and etch cycles. Plasma processes are critical in enabling reproducible dry deposition and etch steps during the manufacturing flow of MEMS and NEMS devices but individual tools need the flexibility to address multiple different applications and process requirements. Increasingly plasma processes are also being adopted in nano-imprint lithography and bonding process steps. Plasma processes may be divided into the following broad families: chemical vapour deposition (CVD), atomic layer deposition (ALD), physical vapour deposition (PVD), surface functionalisation, etch (physically-driven) and etch (chemically-driven). The merits of each plasma technique and their application to emerging devices are discussed – including silicon etch processes that are at the heart of most MEMS and NEMS devices. Here trends are towards higher aspect ratios for enhanced performance and smaller footprint whilst maintaining throughput. Increasingly, large cavities are also being etched to realise membrane-based devices and in multi-wafer stacks where through silicon vias (TSVs) are emerging as a key technology for interconnect. At the research stage, the integration of ALD into MEMS is becoming more common whilst in NEMS devices are taking advantage novel combinations of processes and materials to realise new functions.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Not applicable · Consensus signal: none
GenreCandidate signal: Methods · Consensus signal: none
Teacher disagreement score0.976
Threshold uncertainty score0.511

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.018
GPT teacher head0.245
Teacher spread0.227 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designNot applicable
Domainnot available
GenreMethods

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations1
Published2015
Admission routes1
Has abstractyes

Explore more

Same venueECS TransactionsSame topicNanofabrication and Lithography TechniquesFrench-language works237,207