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Record W2970709580 · doi:10.1109/ectc.2019.00053

Package-on-Package Micro-BGA Microstructure Interaction with Bond and Assembly Parameter

2019· article· en· W2970709580 on OpenAlexaff
Pascale Gagnon, Clement Fortin, Thomas G. Weiss

Bibliographic record

Venuenot available
Typearticle
Languageen
FieldEngineering
TopicElectronic Packaging and Soldering Technologies
Canadian institutionsIBM (Canada)
Fundersnot available
KeywordsInterposerBall grid arraySolderingDie (integrated circuit)Integrated circuit packagingPackage on packageMaterials scienceWire bondingChip-scale packageSystem in packageMicrostructureProcess (computing)Computer scienceMechanical engineeringOptoelectronicsChipEtching (microfabrication)Integrated circuitComposite materialLayer (electronics)NanotechnologyEngineeringWaferTelecommunicationsOperating system

Abstract

fetched live from OpenAlex

Package on Package (PoP) technology can play a vital role in advanced packaging for various reasons. The use of a thin interposer allows for tighter wiring ground rules and can reduce die-to-die latency when placing either multiple die on a single interposer or placing multiple interposers on a larger carrier laminate. This assembly technology can also be of benefit for heterogeneous integration applications. The main challenge for bond and assembly process development with organic to silicon bonding, particularly with thin organic interposers, is to overcome solder join defects (non-wets, bridges) created by highly warped components. To address this issue, two different assembly process flows were developed, namely process A (chip first) and process B (laminate first) with PoP type test vehicle hardware. The assembly was composed of a 23×29mm die with 185μm pitch SAC solder connected to an organic interposer of 37.5×37.5mm dimension and 0.7mm thickness. The bottom side of the interposer, with either CuOSP or NiPdAu pads, was soldered to a 68.5×68.5mm carrier laminate of 1.8mm thickness and CuOSP pads with SAC 305 μBGA solder balls of 0.4mm pitch. To ensure bond and assembly integrity, over 30 cross-sections were performed on the modules from these two process sequences. μBGA's were of first interest as warpage issues forced a thorough optimisation of joining parameters. Microstructure appears with undeniable variations between process sequences and interposer pad surface finishes. Cross-polarized microscopy observation and etching of cross-sections, with over 2500 μBGA characterized, showed that process flow A microstructure was mostly constituted by very large and few grains of beta-Sn phase compared to mainly small interlaced grains for process flow B. IMC's with "chip first" (process flow A) assembly were composed of rare AgSn crystals and several CuSn filaments, which were also observed on "laminate first" (process flow B), but only with NiPdAu interposer pads. Also, for process sequence B with NiPdAu pads, thick plates of AgSn were observed, as opposed to very thin sheets with CuOSP pads. Interim cross-section in the bond and assembly process flows allowed the formulation and verification of a hypothesis on the mechanism that leads to a "laminate first" atypical microstructure. Cooling rates during reflow and interposer pad surface finish will change all the kinetics of intermetallic nucleation and produce eccentric growth. A thorough mechanism understanding will allow a proper process parameter intervention to modulate a desired microstructure from a reliability stand point.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.016
Threshold uncertainty score0.630

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.006
GPT teacher head0.205
Teacher spread0.200 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations7
Published2019
Admission routes1
Has abstractyes

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