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4,299,418 works, Canadian by any of four routes.

Every filter state is a URL; the URL is the query; the query is citable via /q/⟨hash⟩. The page, the API and the export parse the same parameters.

The current cohort, streamed from the database: every work column, the machine labels, the provisional scores, and the per-row validation status. Exports are capped at 100,000 rows. Mints a permanent /q/ link for this exact query. The same filters always produce the same link, whoever asks.

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Integrated Circuits and Semiconductor Failure Analysis
Retraction
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Direct Codex and Gemma labels are unvalidated and sparse. Distilled predictions cover the full frame and are also unvalidated. Choose the evidence source explicitly; absence of a direct label is never a negative label.

affaffiliation
fundfunder
venuejournal
aboutaboutness

The four routes compose: require the funder route and exclude affiliation to get the funder-only stratum no affiliation-based frame ever sees.

352 results · 1 filter active ·
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20002025
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Machine labels · sparse coverage
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An unlabeled work is unknown, not a negative. Label coverage is reported on every query.
352 works in the cohort · of 4,299,418page 6 of 8

Labels cover 0 of 352 works in this cohort. The rest are unlabeled, which is not a negative label: the label table is sparse today and grows as labeling rounds land.

Distilled predictions cover 352 of 352 works in this cohort. Predictions are machine_predicted_unvalidated teacher distillation outputs. Candidate is the union; consensus is the intersection.

affunlabeled
EOTPR Fine Pitch Probing for Die-to-Die Interconnect Failure Analysis
Bernice Zee, Wen Qiu, Aaron Wai Ken Lee, Jesse Alton, Thomas P. White, David D. Kim +1 more
2025· article· Proceedings - International Symposium for Testing and Failure Analysis· Engineering
distilled prediction:candidate · metaepi_narrow+scholarly_communicationconsensus · metaepi_narrow
0
citations
affunlabeled
Rapid Resistive Interconnection Localization
Edward I. Cole, Paiboon Tangyunyong, C.F. Hawkins, Michael R. Bruce, Victoria J. Bruce, Rosalinda M. Ring +1 more
2002· article· en· EDFA Technical Articles· Engineering
distilled prediction:candidate · insufficient_payloadconsensus · none
0
citations
affunlabeled
Package Innovation Roadmap
Christian Schmidt, Yan Li, Bernice Zee, Rohin Agny, Renee Parente, Sebastian Brand +2 more
2023· book-chapter· en· ASM International eBooks· Engineering
distilled prediction:candidate · metaepi_narrow+insufficient_payloadconsensus · insufficient_payload
0
citations
affunlabeled
Tester Assisted Multiple Emission Microscopy
Christian Hollerith, Gerhard Borgmann, Wolfgang Schaller, Christian Burmer, Christof Brillert
2015· article· en· Proceedings - International Symposium for Testing and Failure Analysis· Engineering
distilled prediction:candidate · metaepi_narrowconsensus · none
0
citations
affunlabeled
Spatially-resolved EELS and EDS Analysis of HfO<sub>x</sub>N<sub>y</sub> Gate Dielectrics Deposited by MOCVD using [(C<sub>2</sub>H<sub>5</sub>)<sub>2</sub>N]<sub>4</sub>Hf with NO and O<sub>2</sub>
Xiaohua Wu, Martin Couillard, M.-S. Lee, J. H. Chen, G. A. Botton, D. Landheer +3 more
2004· article· en· Microscopy and Microanalysis· Engineering
distilled prediction:candidate · metaepi_narrow+sts+scholarly_communication+research_integrityconsensus · metaepi_narrow+research_integrity
0
citations

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