The current cohort, streamed from the database: every work column, the machine labels, the provisional scores, and the per-row validation status. Exports are capped at 100,000 rows. Mints a permanent /q/ link for this exact query. The same filters always produce the same link, whoever asks.
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20002025
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Machine labels · sparse coverage
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An unlabeled work is unknown, not a negative. Label coverage is reported on every query.
180 works in the cohort · of 4,299,418page 1 of 4
Labels cover 0 of 180 works in this cohort. The rest are unlabeled, which is not a negative label: the label table is sparse today and grows as labeling rounds land.
Distilled predictions cover 180 of 180 works in this cohort. Predictions are machine_predicted_unvalidated teacher distillation outputs. Candidate is the union; consensus is the intersection.
Mirwais Aktary, Martin O. Jensen, K. L. Westra, Michael J. Brett, M. R. Freeman
2003· article· en· Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena· Engineering
Maria Stepanova, Taras Fito, Z. Szabó, Kamlesh Alti, Adegboyega P. Adeyenuwo, K. Koshelev +2 more
2010· article· en· Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena· Engineering
2013· article· en· Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena· Engineering
2012· article· en· Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena· Engineering
S. T. Coyle, Bassam Shamoun, Mingzhu Yu, José R. Maldonado, Timothy A. Thomas, Douglas E. Holmgren +4 more
2004· article· en· Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena· Engineering
Mohammad Mohammad, Taras Fito, Jiawei Chen, Mirwais Aktary, Maria Stepanova, S. K. Dew
2010· article· en· Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena· Engineering
Mohammad Mohammad, Kolattukudy P. Santo, S. K. Dew, Maria Stepanova
2012· article· en· Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena· Engineering
Mohammad Mohammad, S. K. Dew, K. L. Westra, P. Li, Mirwais Aktary, Y. Lauw +2 more
2007· article· en· Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena· Engineering
Jiashi Shen, Ferhat Aydinoglu, Mohammad Soltani, Bo Cui
2019· article· en· Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena· Engineering